About Us

JTT was founded in Dec, 2012. The headquarters of JTT is located near the Gongdaowu Rd., near by the National Road No. 1 interchange of Hsinchu, Taiwan. We’re dedicated in semiconductor probing device and related components supplier. JTT provides total solution which our product from the design, assembles to the following verification and the maintenance, the integrity provides and meets customer all needs.

For years, enhancing all customer’s competitiveness is JTT’s primary target, as a long-term and trustworthy technology and capacity provider in global semiconductor testing, continuously develops and innovates in technology to provide customers with the best test solutions in order to create customer value.


CEO: Simon Lin
Capital: NT$ 12 Millions
Dec. 2012 JTT Founded (Capital: NT$ 8 Millions)
Mar. 2013 CIS Probe Card Mass Production
Apr. 2013 Cantilever type Probe Card Mass Production
July. 2014 Capital increase ( Capital: NT$ 12Millions)
July. 2015 ISO 9001Certification
Feb. 2017 Singapore Branch Office established

Our Product-Application
JTT Competitive Advantages


Probe cards are made with REW, P7 & Non-clean probe materials. Suitable for Au bumps (LCD drivers), Al pads on memory, Circuit Under Pad (CUP),  low-k and other sensitive devices. Softness characteristic of JTT’s probe provides the following benefits:
Less damage on pads after probing
Low contact force
Smaller scrub mark
Very stable contact resistance
Reduced online cleaning frequency

Ultra Fine Pitch

Ultra fine pitch against gold bumps and aluminum pads. For the latest pitch specs.
By using a special tip treatment, we can achieve minimum scrub damage while maintaining good contact.

High Speed

Probes enable probing of high speed devices. For the latest bandwidth specs.

High Current

Specially designed high-current probes.

Total Solution

One stop product lines for wafer sort and FT.

Local Support

Taiwan area real time customer support.


Flexible approach and rapid service.


Optimization of design.


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