產品介紹 Products
Logical cantilever probe card
Probe cards are made with REW, P7 & Non-clean probe materials.
Suitable for Au bumps (LCD drivers), Al pads on memory, Circuit Under Pad (CUP),  low-k and other sensitive devices.
Softness characteristic of JTT’s probe provides the following benefits:
Less damage on pads after probing
Low contact force
Smaller scrub mark
Very stable contact resistance
Reduced online cleaning frequency
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