Logical cantilever probe card
Probe cards are made with REW, P7 & Non-clean probe materials.
Suitable for Au bumps (LCD drivers), Al pads on memory, Circuit Under Pad (CUP), low-k and other sensitive devices.
Softness characteristic of JTT’s probe provides the following benefits:
Less damage on pads after probing
Low contact force
Smaller scrub mark
Very stable contact resistance
Reduced online cleaning frequency