Products
Cantilever 探針卡
Probe card for image sensor testing
◉ Provide high-performance and high-quality image sensor IC test probe card
◉ Probe materials provide a variety of options to meet customer testing needs
◉ Customized PCB board and mechanism design
◉ Multi-Site up to 64 Sites
◉ Provide optimized solutions for optical applications
◉ Provide A-PHY, C-PHY, D-PHY, SLVS-MI, SLVS-EC test requirements
◉ Mass production of high-frequency probe cards up to 3.5Gsps
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